kw.\*:("Rayos X")
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Intensity of x-ray microbeam formed by a hollow glass pipeFURUTA, K; NAKAYAMA, Y; SHOJI, M et al.Review of scientific instruments. 1991, Vol 62, Num 3, pp 828-829, issn 0034-6748, 2 p.Article
Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article
A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article
High-energy resolution in X-ray scattering with the spectrometer INELAX. I: The principles and the test instrumentBURKEL, E; DORNER, B; ILLINI, T et al.Journal of applied crystallography. 1991, Vol 24, pp 1042-1050, issn 0021-8898, 6Article
Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating systemWIGNALL, G. D; LIN, J. S; SPOONER, S et al.Journal of applied crystallography. 1990, Vol 23, pp 241-245, issn 0021-8898, 4Article
Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article
Design and analysis of aspherical multilayer imaging x-ray microscopeSHEALY, D. L; WU JIANG; HOOVER, R. B et al.Optical engineering (Bellingham. Print). 1991, Vol 30, Num 8, pp 1094-1099, issn 0091-3286Article
Evaluation of analytical instrumentation. VI, Wavelength dispersive X-ray spectrometersAnalytical proceedings. 1990, Vol 27, Num 12, pp 324-333, issn 0144-557XArticle
Moderate energy flash x rays with large dose-area product produced by AuroraKERRIS, K. G; AGEE, F. J; WHITTAKER, D. A et al.Journal of applied physics. 1989, Vol 65, Num 1, pp 5-8, issn 0021-8979Article
Imagerie et microscopie X = X-rays imaging and microscopyDHEZ, P.Revue pratique de contrôle industriel (1984). 1992, Vol 31, Num 176BIS, pp 64-71, issn 0766-5210Article
An automatic four-circle diffractometer designed for precise lattice-parameter determinationKUCHARCZYK, D; PIETRASZKO, A; ŁUKASEWICZ, K et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 467, 3Article
Accuracy in powder diffraction II. International conferencePRINCE, E; STALICK, J. K.NIST special publication. 1992, Num 846, issn 1048-776X, 237 p.Conference Proceedings
Characterization of multilayer x-ray analyzers: models and measurementsHENKE, B. L; UEJIO, J. Y; YAMADA, H. T et al.Optical engineering (Bellingham. Print). 1986, Vol 25, Num 8, pp 937-947, issn 0091-3286Article
High-resolution imaging by Fourier transform X-ray holographyMCNULTY, I; KIRZ, J; JACOBSEN, C et al.Science (Washington, D.C.). 1992, Vol 256, Num 5059, pp 1009-1012, issn 0036-8075Article
A soft x-ray analyzer crystal-octadecyl hydrogen maleate (OHM)GUAN TIETANG; TUNG TSANG.Chinese physics. 1991, Vol 11, Num 4, pp 934-937, issn 0273-429XArticle
Design of upgraded plane grating monochromators using variable spacing gratingsERME, E; TRUUSALU, P.Journal of optics. 1993, Vol 24, Num 1, pp 43-47, issn 0150-536XConference Paper
Resolution in solf X-ray microscopesJACOBSEN, C; KIRZ, J; WILLIAMS, S et al.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 55-79, issn 0304-3991Conference Paper
Signal to noise ratio in soft X-ray holographyNUGENT, K. A.Journal of modern optics (Print). 1991, Vol 38, Num 3, pp 553-563, issn 0950-0340, 11 p.Article
High-speed contact X-ray microscopy with undulator radiationAOKI, S; SHINOHARA, K; MAEZAWA, H et al.Japanese journal of applied physics. 1986, Vol 25, Num 3, pp 508-509, issn 0021-4922, 1Article
Normal-incidence X-ray microscope for carbon Kα radiation with 0.5 μm resolutionMURAKAMI, K; OSHINO, T; NAKAMURA, H et al.Japanese journal of applied physics. 1992, Vol 31, Num 10B, pp L1500-L1502, issn 0021-4922, 2Article
X-RAY SPECSKOHLER, A; BONVIN, D; YELLEPEDDI, R et al.Hydrocarbon engineering. 2008, Vol 13, Num 2, issn 1468-9340, 48-53 [3 p.]Article
Establishing standard X-ray exposuresMCBRIDE, D.Materials evaluation. 1990, Vol 48, Num 10, pp 1244-1247, issn 0025-5327Article
Radiation protection for an intra-operative X-ray deviceEATON, D. J; GONZALEZ, R; DUCK, S et al.British journal of radiology. 2011, Vol 84, Num 1007, pp 1034-1039, issn 0007-1285, 6 p.Article
Piezo and pyroelectric radiation dosimetryDE CARVALHO, A. A; MASCARENHAS, S.IEEE transactions on electrical insulation. 1992, Vol 27, Num 4, pp 835-842, issn 0018-9367Conference Paper
Moving towards x-ray accuracyFESS, Scott.Hydrocarbon engineering. 2005, Vol 10, Num 1, pp 55-58, issn 1468-9340, 3 p.Article